Anodic Stripping Voltammetry of Tellurium (IV) in 1.0M NH4, SCN at Rotating Disk Gallium - Thin-Film Electrode.

Authors

Mojeed Tunde Olayiwola, University of Alabama at Birmingham

Document Type

Thesis

Date of Award

1981

Abstract

The electroanalytical technique of anodic stripping voltammetry (ASV), using a gallium-thin film electrode in 1.0M NH4SCN at 60°C has been applied to study the electroanalytical chemistry of Te(IV). Both externally plated and in-situ plated thin-film gallium on rotating glassy carbon disk electrodes are presented. Detection limits of Te(IV) on various monolayer equivalents of gallium plated on a solid glassy carbon electrode are also presented. The sensitivity of this method, which is 1x10-9 TE(IV), is comparable to that of anodic stripping voltammetry using gold-plated electrodes.

Comments

MS - Master of Science/Master of Surgery; ProQuest publication number 31752031

Recommended Citation

Olayiwola, Mojeed Tunde, "Anodic Stripping Voltammetry of Tellurium (IV) in 1.0M NH4, SCN at Rotating Disk Gallium - Thin-Film Electrode." (1981). All ETDs from UAB. 7111.
https://digitalcommons.library.uab.edu/etd-collection/7111