Advisory Committee Chair
Yogesh K Vohra
Advisory Committee Members
Shane A Catledge
Andrew A Wereszczak
Document Type
Thesis
Date of Award
2017
Degree Name by School
Master of Science (MS) College of Arts and Sciences
Abstract
Multi-angle energy-dispersive X-ray diffraction and white-beam radiography studies were conducted on a borosilicate glass sample (17.6% B2O3) to 13.7 GPa in a Paris-Edinburgh (PE) press at Beamline 16-BM-B, HPCAT, The Advanced Photon Source, Argonne National Laboratory. The measured structure factor S(q) to q = 19 Ã -1 was used to determine internuclear bond distances between various species of atoms contained in the glass sample. Gold foil was used as the pressure standard. Bond distances for Si-O, O-O, and Si-Si were determined from the reduced pair distribution function G(r) and were measured as a function of pressure. The sample height, as determined via white-beam radiography, showed an overall uniaxial compression of 22.5% at 13.7 GPa and a 10.6% permanent compaction after decompression to ambient conditions. Raman spectroscopy of the pressure recovered borosilicate glass sample as compared to the bulk starting material shows blue-shift and changes in intensities and widths of the Raman bands associated with four-coordinated boron and silicate rings.
Recommended Citation
Ham, Kathryn Jinae, "White-Beam X-Ray Diffraction and Radiography Studies on High-Boron-Containing Borosilicate Glass at High Pressures" (2017). All ETDs from UAB. 1848.
https://digitalcommons.library.uab.edu/etd-collection/1848