Characterization of point defect centers in three polytypes of silicon carbide.

Authors

Patricia Jeane MacFarlane

Document Type

Dissertation

Date of Award

2000

ProQuest Publication Number

Document on ProQuest

ISBN

978-0-599-69077-6

Comments

PhD - ProQuest publication number 9964641

Recommended Citation

MacFarlane, Patricia Jeane, "Characterization of point defect centers in three polytypes of silicon carbide." (2000). All ETDs from UAB. 6438.
https://digitalcommons.library.uab.edu/etd-collection/6438